BibTeX record journals/mr/MagnoneBM18

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@article{DBLP:journals/mr/MagnoneBM18,
  author       = {Paolo Magnone and
                  Giacomo Barletta and
                  A. Magr{\`{\i}}},
  title        = {Investigation of degradation mechanisms in low-voltage p-channel power
                  MOSFETs under High Temperature Gate Bias stress},
  journal      = {Microelectron. Reliab.},
  volume       = {88-90},
  pages        = {438--442},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2018.06.029},
  doi          = {10.1016/J.MICROREL.2018.06.029},
  timestamp    = {Sat, 22 Feb 2020 19:27:34 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/MagnoneBM18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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