BibTeX record: journals/mr/MachouatHGLPPFE08

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@article{DBLP:journals/mr/MachouatHGLPPFE08,
  author    = {Aziz Machouat and
               G. Haller and
               Vincent Goubier and
               Dean Lewis and
               Philippe Perdu and
               Vincent Pouget and
               Pascal Fouillat and
               F. Essely},
  title     = {Effect of physical defect on shmoos in {CMOS} {DSM} technologies.},
  journal   = {Microelectronics Reliability},
  year      = {2008},
  volume    = {48},
  number    = {8-9},
  pages     = {1333--1338},
  url       = {http://dx.doi.org/10.1016/j.microrel.2008.07.043},
  doi       = {10.1016/j.microrel.2008.07.043},
  timestamp = {Wed, 03 Sep 2014 06:51:12 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/journals/mr/MachouatHGLPPFE08},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}