<?xml version="1.0"?>
<dblp>
<article key="journals/mr/LvMCZZLXMRH11" mdate="2011-12-19">
<author>Ling Lv</author>
<author>J. G. Ma</author>
<author>Y. R. Cao</author>
<author>J. C. Zhang</author>
<author>W. Zhang</author>
<author>L. Li</author>
<author>S. R. Xu</author>
<author>X. H. Ma</author>
<author>X. T. Ren</author>
<author>Y. Hao</author>
<title>Study of proton irradiation effects on AlGaN/GaN high electron mobility transistors.</title>
<pages>2168-2172</pages>
<year>2011</year>
<volume>51</volume>
<journal>Microelectronics Reliability</journal>
<number>12</number>
<ee>http://dx.doi.org/10.1016/j.microrel.2011.04.022</ee>
<url>db/journals/mr/mr51.html#LvMCZZLXMRH11</url>
</article>
</dblp>
