BibTeX record: journals/mr/LucarelliCMCC03

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@article{DBLP:journals/mr/LucarelliCMCC03,
  author    = {N. Lucarelli and
               M. Cavone and
               M. Muschitiello and
               D. Centrone and
               F. Corsi},
  title     = {Thermally Induced Voltage Alteration {(TIVA)} applied to {ESD} induced
               failures},
  journal   = {Microelectronics Reliability},
  volume    = {43},
  number    = {9-11},
  pages     = {1699--1704},
  year      = {2003},
  url       = {http://dx.doi.org/10.1016/S0026-2714(03)00337-8},
  doi       = {10.1016/S0026-2714(03)00337-8},
  timestamp = {Sun, 25 Mar 2007 16:37:04 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/journals/mr/LucarelliCMCC03},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}