BibTeX record journals/mr/LuCLCWHH11

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@article{DBLP:journals/mr/LuCLCWHH11,
  author       = {Chun{-}Chang Lu and
                  Kuei{-}Shu Chang{-}Liao and
                  Chun{-}Yuan Lu and
                  Shih{-}Cheng Chang and
                  Tien{-}Ko Wang and
                  Fu{-}Chung Hou and
                  Yao{-}Tung Hsu},
  title        = {Tunneling component suppression in charge pumping measurement and
                  reliability study for high-k gated MOSFETs},
  journal      = {Microelectron. Reliab.},
  volume       = {51},
  number       = {12},
  pages        = {2110--2114},
  year         = {2011},
  url          = {https://doi.org/10.1016/j.microrel.2011.04.021},
  doi          = {10.1016/J.MICROREL.2011.04.021},
  timestamp    = {Sat, 22 Feb 2020 19:27:17 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LuCLCWHH11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}