BibTeX record journals/mr/LiuZLKESH10

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@article{DBLP:journals/mr/LiuZLKESH10,
  author       = {Jie Liu and
                  Jicheng Zhou and
                  Hongwei Luo and
                  Xuedong Kong and
                  Yunfei En and
                  Qian Shi and
                  Yujuan He},
  title        = {Total-dose-induced edge effect in {SOI} {NMOS} transistors with different
                  layouts},
  journal      = {Microelectron. Reliab.},
  volume       = {50},
  number       = {1},
  pages        = {45--47},
  year         = {2010},
  url          = {https://doi.org/10.1016/j.microrel.2009.09.003},
  doi          = {10.1016/J.MICROREL.2009.09.003},
  timestamp    = {Sat, 22 Feb 2020 19:28:27 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LiuZLKESH10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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