BibTeX record journals/mr/LiuXGGWLD18

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@article{DBLP:journals/mr/LiuXGGWLD18,
  author       = {Xianqiang Liu and
                  Xiaodi Xu and
                  Chenjie Gu and
                  Renyuan Gu and
                  Weiwei Wang and
                  Wenjun Liu and
                  Tianli Duan},
  title        = {Investigating the impact of the defect dynamic characteristics on
                  the {PBTI} in the high-{\(\kappa\)} gate device},
  journal      = {Microelectron. Reliab.},
  volume       = {80},
  pages        = {24--28},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2017.11.012},
  doi          = {10.1016/J.MICROREL.2017.11.012},
  timestamp    = {Sat, 22 Feb 2020 19:28:18 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LiuXGGWLD18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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