BibTeX record journals/mr/LiuHZ02

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@article{DBLP:journals/mr/LiuHZ02,
  author       = {Hongxia Liu and
                  Yue Hao and
                  Jiangang Zhu},
  title        = {A thorough investigation of hot-carrier-induced gate oxide breakdown
                  in partially depleted {N-} and P-channel {SIMOX} MOSFETs},
  journal      = {Microelectron. Reliab.},
  volume       = {42},
  number       = {7},
  pages        = {1037--1044},
  year         = {2002},
  url          = {https://doi.org/10.1016/S0026-2714(02)00070-7},
  doi          = {10.1016/S0026-2714(02)00070-7},
  timestamp    = {Sat, 22 Feb 2020 19:28:54 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LiuHZ02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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