BibTeX record journals/mr/LiuCCM15

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@article{DBLP:journals/mr/LiuCCM15,
  author       = {Taizhi Liu and
                  Chang{-}Chih Chen and
                  Soonyoung Cha and
                  Linda Milor},
  title        = {System-level variation-aware aging simulator using a unified novel
                  gate-delay model for bias temperature instability, hot carrier injection,
                  and gate oxide breakdown},
  journal      = {Microelectron. Reliab.},
  volume       = {55},
  number       = {9-10},
  pages        = {1334--1340},
  year         = {2015},
  url          = {https://doi.org/10.1016/j.microrel.2015.06.008},
  doi          = {10.1016/J.MICROREL.2015.06.008},
  timestamp    = {Mon, 03 Jan 2022 22:10:57 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LiuCCM15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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