@article{DBLP:journals/mr/LinHCK03,
author = {I-Cheng Lin and
Chih-Yao Huang and
Chuan-Jane Chao and
Ming-Dou Ker},
title = {Anomalous latchup failure induced by on-chip ESD protection
circuit in a high-voltage CMOS IC product},
journal = {Microelectronics Reliability},
volume = {43},
number = {8},
year = {2003},
pages = {1295-1301},
ee = {http://dx.doi.org/10.1016/S0026-2714(03)00139-2},
bibsource = {DBLP, http://dblp.uni-trier.de}
}