BibTeX record journals/mr/LimeGG03

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@article{DBLP:journals/mr/LimeGG03,
  author       = {Fran{\c{c}}ois Lime and
                  G{\'{e}}rard Ghibaudo and
                  B. Guillaumot},
  title        = {Charge trapping in SiO2/HfO2/TiN gate stack},
  journal      = {Microelectron. Reliab.},
  volume       = {43},
  number       = {9-11},
  pages        = {1445--1448},
  year         = {2003},
  url          = {https://doi.org/10.1016/S0026-2714(03)00256-7},
  doi          = {10.1016/S0026-2714(03)00256-7},
  timestamp    = {Sat, 22 Feb 2020 19:28:25 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LimeGG03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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