Z. Li Tom Schram Luigi Pantisano A. Stesmans Thierry Conard S. Shamuilia V. V. Afanasiev A. Akheyar Sven Van Elshocht D. P. Brunco W. Deweerd Y. Naoki P. Lehnen Stefan De Gendt Kristin De Meyer 518-520 2007 47 Microelectronics Reliability 4-5 http://dx.doi.org/10.1016/j.microrel.2007.01.054 db/journals/mr/mr47.html#LiSPSCSAAEBDNLGM07