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BibTeX record journals/mr/LiGBKPZ08
@article{DBLP:journals/mr/LiGBKPZ08, author = {Q. Li and J. F. L. Goosen and J. T. M. van Beek and Fred van Keulen and K. L. Phan and G. Q. Zhang}, title = {Failure analysis of a thin-film nitride {MEMS} package}, journal = {Microelectron. Reliab.}, volume = {48}, number = {8-9}, pages = {1557--1561}, year = {2008}, url = {https://doi.org/10.1016/j.microrel.2008.07.036}, doi = {10.1016/J.MICROREL.2008.07.036}, timestamp = {Sat, 22 Feb 2020 19:26:58 +0100}, biburl = {https://dblp.org/rec/journals/mr/LiGBKPZ08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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