BibTeX record journals/mr/LiCLD18

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@article{DBLP:journals/mr/LiCLD18,
  author       = {Hao Li and
                  Mifang Cong and
                  Ke Li and
                  Huan Du},
  title        = {Source engineering on ruggedness and {RF} performance of n-channel
                  {RFLDMOS}},
  journal      = {Microelectron. Reliab.},
  volume       = {87},
  pages        = {57--63},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2018.06.001},
  doi          = {10.1016/J.MICROREL.2018.06.001},
  timestamp    = {Sat, 22 Feb 2020 19:28:40 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LiCLD18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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