BibTeX record journals/mr/LiCCHLGCWHCY17

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@article{DBLP:journals/mr/LiCCHLGCWHCY17,
  author       = {Yan{-}Lin Li and
                  Kuei{-}Shu Chang{-}Liao and
                  Yu{-}Wei Chang and
                  Tse{-}Jung Huang and
                  Chen{-}Chien Li and
                  Zhao{-}Chen Gu and
                  Po{-}Yen Chen and
                  Tzung{-}Yu Wu and
                  Jiayi Huang and
                  Fu{-}Chuan Chu and
                  Shih{-}Han Yi},
  title        = {Improved reliability characteristics of Ge {MOS} devices by capping
                  Hf or Zr on interfacial layer},
  journal      = {Microelectron. Reliab.},
  volume       = {79},
  pages        = {136--139},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.10.018},
  doi          = {10.1016/J.MICROREL.2017.10.018},
  timestamp    = {Sat, 22 Feb 2020 19:28:18 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LiCCHLGCWHCY17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}