Stop the war!
Остановите войну!
for scientists:
default search action
BibTeX record journals/mr/LeyrisMHVV07
@article{DBLP:journals/mr/LeyrisMHVV07, author = {C{\'{e}}dric Leyris and Fr{\'{e}}d{\'{e}}ric Martinez and Alain Hoffmann and M. Valenza and J. C. Vildeuil}, title = {{N-MOSFET} oxide trap characterization induced by nitridation process using {RTS} noise analysis}, journal = {Microelectron. Reliab.}, volume = {47}, number = {1}, pages = {41--45}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.02.010}, doi = {10.1016/J.MICROREL.2006.02.010}, timestamp = {Tue, 03 Nov 2020 17:24:53 +0100}, biburl = {https://dblp.org/rec/journals/mr/LeyrisMHVV07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.