BibTeX record journals/mr/LefebvreGB09

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@article{DBLP:journals/mr/LefebvreGB09,
  author       = {Jean Luc Lefebvre and
                  Christian Gautier and
                  Fr{\'{e}}d{\'{e}}ric Barbier},
  title        = {Correlation between {EOS} customer return failure cases and Over Voltage
                  Stress {(OVS)} test method},
  journal      = {Microelectron. Reliab.},
  volume       = {49},
  number       = {9-11},
  pages        = {952--957},
  year         = {2009},
  url          = {https://doi.org/10.1016/j.microrel.2009.07.030},
  doi          = {10.1016/J.MICROREL.2009.07.030},
  timestamp    = {Sat, 22 Feb 2020 19:28:50 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LefebvreGB09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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