![](https://dblp.uni-trier.de/img/logo.ua.320x120.png)
![](https://dblp.uni-trier.de/img/dropdown.dark.16x16.png)
![](https://dblp.uni-trier.de/img/peace.dark.16x16.png)
Остановите войну!
for scientists:
![search dblp search dblp](https://dblp.uni-trier.de/img/search.dark.16x16.png)
![search dblp](https://dblp.uni-trier.de/img/search.dark.16x16.png)
default search action
BibTeX record journals/mr/LefebvreGB09
@article{DBLP:journals/mr/LefebvreGB09, author = {Jean Luc Lefebvre and Christian Gautier and Fr{\'{e}}d{\'{e}}ric Barbier}, title = {Correlation between {EOS} customer return failure cases and Over Voltage Stress {(OVS)} test method}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {952--957}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.030}, doi = {10.1016/J.MICROREL.2009.07.030}, timestamp = {Sat, 22 Feb 2020 19:28:50 +0100}, biburl = {https://dblp.org/rec/journals/mr/LefebvreGB09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
![](https://dblp.uni-trier.de/img/cog.dark.24x24.png)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.