BibTeX record journals/mr/LeeYKYP06

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@article{DBLP:journals/mr/LeeYKYP06,
  author       = {In Kyung Lee and
                  Se Re Na Yun and
                  Kyosun Kim and
                  Chong{-}Gun Yu and
                  Jong Tae Park},
  title        = {New experimental findings on hot-carrier-induced degradation in lateral
                  {DMOS} transistors},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1864--1867},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.071},
  doi          = {10.1016/J.MICROREL.2006.07.071},
  timestamp    = {Sun, 02 Oct 2022 15:44:02 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/LeeYKYP06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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