BibTeX record journals/mr/LeeRBBGL04

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@article{DBLP:journals/mr/LeeRBBGL04,
  author       = {Simone Lee and
                  Ramesh Ramadoss and
                  Michael Buck and
                  V. M. Bright and
                  K. C. Gupta and
                  Y. C. Lee},
  title        = {Reliability testing of flexible printed circuit-based {RF} {MEMS}
                  capacitive switches},
  journal      = {Microelectron. Reliab.},
  volume       = {44},
  number       = {2},
  pages        = {245--250},
  year         = {2004},
  url          = {https://doi.org/10.1016/j.microrel.2003.09.002},
  doi          = {10.1016/J.MICROREL.2003.09.002},
  timestamp    = {Sat, 22 Feb 2020 19:27:10 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LeeRBBGL04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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