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BibTeX record journals/mr/LeeLWM01
@article{DBLP:journals/mr/LeeLWM01, author = {Yung{-}Huei Lee and Tom Linton and Ken Wu and Neal R. Mielke}, title = {Effect of trench edge on pMOSFET reliability}, journal = {Microelectron. Reliab.}, volume = {41}, number = {5}, pages = {689--696}, year = {2001}, url = {https://doi.org/10.1016/S0026-2714(01)00002-6}, doi = {10.1016/S0026-2714(01)00002-6}, timestamp = {Sat, 22 Feb 2020 19:27:57 +0100}, biburl = {https://dblp.org/rec/journals/mr/LeeLWM01.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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