BibTeX record: journals/mr/LeeLLWSL08

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@article{DBLP:journals/mr/LeeLLWSL08,
  author    = {S. Lee and
               J. P. Long and
               Gerald Lucovsky and
               J. L. Whitten and
               H. Seo and
               J. L\"{u}ning},
  title     = {Suppression of Ge-O and Ge-N bonding at Ge-HfO\({}_{\mbox{2}}\) and
               Ge-TiO\({}_{\mbox{2}}\) interfaces by deposition onto plasma-nitrided
               passivated Ge substrates: Integration issues Ge gate stacks into advanced
               devices.},
  journal   = {Microelectronics Reliability},
  year      = {2008},
  volume    = {48},
  number    = {3},
  pages     = {364--369},
  url       = {http://dx.doi.org/10.1016/j.microrel.2007.07.068},
  doi       = {10.1016/j.microrel.2007.07.068},
  timestamp = {Wed, 03 Sep 2014 09:45:08 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/journals/mr/LeeLLWSL08},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}