BibTeX record journals/mr/LeeLLP11

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@article{DBLP:journals/mr/LeeLLP11,
  author       = {Seung Min Lee and
                  Dong Hun Lee and
                  Jae Ki Lee and
                  Jong Tae Park},
  title        = {Concurrent {PBTI} and hot carrier degradation in n-channel MuGFETs},
  journal      = {Microelectron. Reliab.},
  volume       = {51},
  number       = {9-11},
  pages        = {1544--1546},
  year         = {2011},
  url          = {https://doi.org/10.1016/j.microrel.2011.06.006},
  doi          = {10.1016/J.MICROREL.2011.06.006},
  timestamp    = {Thu, 21 Apr 2022 11:57:24 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/LeeLLP11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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