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BibTeX record journals/mr/LeeLLP11
@article{DBLP:journals/mr/LeeLLP11, author = {Seung Min Lee and Dong Hun Lee and Jae Ki Lee and Jong Tae Park}, title = {Concurrent {PBTI} and hot carrier degradation in n-channel MuGFETs}, journal = {Microelectron. Reliab.}, volume = {51}, number = {9-11}, pages = {1544--1546}, year = {2011}, url = {https://doi.org/10.1016/j.microrel.2011.06.006}, doi = {10.1016/J.MICROREL.2011.06.006}, timestamp = {Thu, 21 Apr 2022 11:57:24 +0200}, biburl = {https://dblp.org/rec/journals/mr/LeeLLP11.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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