BibTeX record journals/mr/LeeHYP15

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@article{DBLP:journals/mr/LeeHYP15,
  author       = {Jae Hoon Lee and
                  Jin{-}Woo Han and
                  Chong{-}Gun Yu and
                  Jong Tae Park},
  title        = {Effect of source and drain asymmetry on hot carrier degradation in
                  vertical nanowire MOSFETs},
  journal      = {Microelectron. Reliab.},
  volume       = {55},
  number       = {9-10},
  pages        = {1456--1459},
  year         = {2015},
  url          = {https://doi.org/10.1016/j.microrel.2015.06.062},
  doi          = {10.1016/J.MICROREL.2015.06.062},
  timestamp    = {Sun, 02 Oct 2022 15:44:02 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/LeeHYP15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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