BibTeX record journals/mr/LeeC03

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@article{DBLP:journals/mr/LeeC03,
  author       = {Jon C. Lee and
                  J. H. Chuang},
  title        = {A Novel Application of {C-AFM:} Deep Sub-micron Single Probing for
                  {IC} Failure Analysis},
  journal      = {Microelectron. Reliab.},
  volume       = {43},
  number       = {9-11},
  pages        = {1687--1692},
  year         = {2003},
  url          = {https://doi.org/10.1016/S0026-2714(03)00335-4},
  doi          = {10.1016/S0026-2714(03)00335-4},
  timestamp    = {Sat, 22 Feb 2020 19:28:44 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LeeC03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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