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BibTeX record journals/mr/LaiYY08
@article{DBLP:journals/mr/LaiYY08, author = {Yi{-}Shao Lai and Po{-}Chuan Yang and Chang{-}Lin Yeh}, title = {Effects of different drop test conditions on board-level reliability of chip-scale packages}, journal = {Microelectron. Reliab.}, volume = {48}, number = {2}, pages = {274--281}, year = {2008}, url = {https://doi.org/10.1016/j.microrel.2007.03.005}, doi = {10.1016/J.MICROREL.2007.03.005}, timestamp = {Sat, 22 Feb 2020 19:28:57 +0100}, biburl = {https://dblp.org/rec/journals/mr/LaiYY08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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