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BibTeX record journals/mr/KwonKPLPAL04
@article{DBLP:journals/mr/KwonKPLPAL04, author = {Hyuck In Kwon and In Man Kang and Byung{-}Gook Park and Jong Duk Lee and Sang Sik Park and Jung Chak Ahn and Yong Hee Lee}, title = {Effects of electrical stress on mid-gap interface trap density and capture cross sections in n-MOSFETs characterized by pulsed interface probing measurements}, journal = {Microelectron. Reliab.}, volume = {44}, number = {1}, pages = {47--51}, year = {2004}, url = {https://doi.org/10.1016/S0026-2714(03)00161-6}, doi = {10.1016/S0026-2714(03)00161-6}, timestamp = {Sat, 22 Feb 2020 19:26:52 +0100}, biburl = {https://dblp.org/rec/journals/mr/KwonKPLPAL04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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