BibTeX record journals/mr/KwonKPLPAL04

• > Home > journals/mr/KwonKPLPAL04

@article{DBLP:journals/mr/KwonKPLPAL04,
  author       = {Hyuck In Kwon and
                  In Man Kang and
                  Byung{-}Gook Park and
                  Jong Duk Lee and
                  Sang Sik Park and
                  Jung Chak Ahn and
                  Yong Hee Lee},
  title        = {Effects of electrical stress on mid-gap interface trap density and
                  capture cross sections in n-MOSFETs characterized by pulsed interface
                  probing measurements},
  journal      = {Microelectron. Reliab.},
  volume       = {44},
  number       = {1},
  pages        = {47--51},
  year         = {2004},
  url          = {https://doi.org/10.1016/S0026-2714(03)00161-6},
  doi          = {10.1016/S0026-2714(03)00161-6},
  timestamp    = {Sat, 22 Feb 2020 19:26:52 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/KwonKPLPAL04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}