BibTeX record journals/mr/KusumotoOHTNUKS16

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@article{DBLP:journals/mr/KusumotoOHTNUKS16,
  author       = {Osamu Kusumoto and
                  Atsushi Ohoka and
                  Nobuyuki Horikawa and
                  Kohtaro Tanaka and
                  Masahiko Niwayama and
                  Masao Uchida and
                  Yoshihiko Kanzawa and
                  Kazuyuki Sawada and
                  Tetsuzo Ueda},
  title        = {Reliability of Diode-Integrated SiC Power MOSFET(DioMOS)},
  journal      = {Microelectron. Reliab.},
  volume       = {58},
  pages        = {158--163},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2015.11.033},
  doi          = {10.1016/J.MICROREL.2015.11.033},
  timestamp    = {Mon, 26 Oct 2020 08:59:25 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/KusumotoOHTNUKS16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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