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DBLP BibTeX Record 'journals/mr/KrishnanKMMBL02'

@article{DBLP:journals/mr/KrishnanKMMBL02,
  author    = {Mahesh S. Krishnan and
               Viktor Kol'dyaev and
               Eiji Morifoji and
               Koji Miyamoto and
               Tomasz Brozek and
               Xiaolei Li},
  title     = {Series resistance degradation due to NBTI in PMOSFET},
  journal   = {Microelectronics Reliability},
  volume    = {42},
  number    = {9-11},
  year      = {2002},
  pages     = {1433-1438},
  ee        = {http://dx.doi.org/10.1016/S0026-2714(02)00164-6},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}