G. A. Koné Brice Grandchamp C. Hainaut François Marc C. Maneux Nathalie Labat Thomas Zimmer Virginie Nodjiadjim Muriel Riet Jean Godin Reliability of submicron InGaAs/InP DHBT under thermal and electrical stresses. 1730-1735 2011 51 Microelectronics Reliability 9-11 http://dx.doi.org/10.1016/j.microrel.2011.07.073 db/journals/mr/mr51.html#KoneGHMMLZNRG11