BibTeX record journals/mr/KimP15

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@article{DBLP:journals/mr/KimP15,
  author       = {Dae Hyun Kim and
                  Jong Tae Park},
  title        = {Investigation on stress induced hump phenomenon in {IGZO} thin film
                  transistors under negative bias stress and illumination},
  journal      = {Microelectron. Reliab.},
  volume       = {55},
  number       = {9-10},
  pages        = {1811--1814},
  year         = {2015},
  url          = {https://doi.org/10.1016/j.microrel.2015.06.024},
  doi          = {10.1016/J.MICROREL.2015.06.024},
  timestamp    = {Wed, 20 Apr 2022 09:06:42 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/KimP15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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