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BibTeX record journals/mr/KimP15
@article{DBLP:journals/mr/KimP15, author = {Dae Hyun Kim and Jong Tae Park}, title = {Investigation on stress induced hump phenomenon in {IGZO} thin film transistors under negative bias stress and illumination}, journal = {Microelectron. Reliab.}, volume = {55}, number = {9-10}, pages = {1811--1814}, year = {2015}, url = {https://doi.org/10.1016/j.microrel.2015.06.024}, doi = {10.1016/J.MICROREL.2015.06.024}, timestamp = {Wed, 20 Apr 2022 09:06:42 +0200}, biburl = {https://dblp.org/rec/journals/mr/KimP15.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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