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BibTeX record journals/mr/KimM17
@article{DBLP:journals/mr/KimM17, author = {Dae{-}Hyun Kim and Linda Milor}, title = {Analysis of errors in estimating wearout characteristics of time-dependent dielectric breakdown using system-level accelerated life test}, journal = {Microelectron. Reliab.}, volume = {76-77}, pages = {47--52}, year = {2017}, url = {https://doi.org/10.1016/j.microrel.2017.06.039}, doi = {10.1016/J.MICROREL.2017.06.039}, timestamp = {Thu, 06 Jan 2022 17:15:05 +0100}, biburl = {https://dblp.org/rec/journals/mr/KimM17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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