BibTeX record journals/mr/KimKCPJSSC13

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@article{DBLP:journals/mr/KimKCPJSSC13,
  author       = {K. S. Kim and
                  H. J. Kim and
                  P. H. Choi and
                  H. S. Park and
                  I. H. Joo and
                  J. E. Song and
                  D. H. Song and
                  Byoung Deog Choi},
  title        = {Hot hole-induced device degradation by drain junction reverse current},
  journal      = {Microelectron. Reliab.},
  volume       = {53},
  number       = {7},
  pages        = {947--951},
  year         = {2013},
  url          = {https://doi.org/10.1016/j.microrel.2013.04.006},
  doi          = {10.1016/J.MICROREL.2013.04.006},
  timestamp    = {Wed, 08 Apr 2020 18:03:15 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/KimKCPJSSC13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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