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DBLP BibTeX Record 'journals/mr/KhooTV03'

@article{DBLP:journals/mr/KhooTV03,
  author    = {Sherry Suat Cheng Khoo and
               Pee Ya Tan and
               Steven H. Voldman},
  title     = {Microanalysis and electromigration reliability performance
               of high current transmission line pulse (TLP) stressed copper
               interconnects},
  journal   = {Microelectronics Reliability},
  volume    = {43},
  number    = {7},
  year      = {2003},
  pages     = {1039-1045},
  ee        = {http://dx.doi.org/10.1016/S0026-2714(03)00133-1},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}