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BibTeX record journals/mr/KhanLBBL17
@article{DBLP:journals/mr/KhanLBBL17, author = {Saqib A. Khan and Chul Seung Lim and GeunYong Bak and Sanghyeon Baeg and Soonyoung Lee}, title = {An alternative approach to measure alpha-particle-induced {SEU} cross-section for flip-chip packaged {SRAM} devices: High energy alpha backside irradiation}, journal = {Microelectron. Reliab.}, volume = {69}, pages = {100--108}, year = {2017}, url = {https://doi.org/10.1016/j.microrel.2016.12.004}, doi = {10.1016/J.MICROREL.2016.12.004}, timestamp = {Sat, 22 Feb 2020 19:27:18 +0100}, biburl = {https://dblp.org/rec/journals/mr/KhanLBBL17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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