Robust, versatile, direct low-frequency noise characterization method for material/process quality control using cross-shaped 4-terminal devices.

A. Kerlain V. Mosser Robust, versatile, direct low-frequency noise characterization method for material/process quality control using cross-shaped 4-terminal devices. 1327-1330 2005 45 Microelectronics Reliability 9-11 http://dx.doi.org/10.1016/j.microrel.2005.07.015 db/journals/mr/mr45.html#KerlainM05