BibTeX record journals/mr/KellyDOB05

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@article{DBLP:journals/mr/KellyDOB05,
  author       = {David Q. Kelly and
                  Sagnik Dey and
                  David Onsongo and
                  Sanjay K. Banerjee},
  title        = {Considerations for evaluating hot-electron reliability of strained
                  Si n-channel MOSFETs},
  journal      = {Microelectron. Reliab.},
  volume       = {45},
  number       = {7-8},
  pages        = {1033--1040},
  year         = {2005},
  url          = {https://doi.org/10.1016/j.microrel.2005.01.011},
  doi          = {10.1016/J.MICROREL.2005.01.011},
  timestamp    = {Wed, 27 Oct 2021 08:57:43 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/KellyDOB05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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