BibTeX record journals/mr/KeaneKWK10

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@article{DBLP:journals/mr/KeaneKWK10,
  author       = {John Keane and
                  Tony Tae{-}Hyoung Kim and
                  Xiaofei Wang and
                  Chris H. Kim},
  title        = {On-chip reliability monitors for measuring circuit degradation},
  journal      = {Microelectron. Reliab.},
  volume       = {50},
  number       = {8},
  pages        = {1039--1053},
  year         = {2010},
  url          = {https://doi.org/10.1016/j.microrel.2010.04.024},
  doi          = {10.1016/J.MICROREL.2010.04.024},
  timestamp    = {Sat, 22 Feb 2020 19:27:59 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/KeaneKWK10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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