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BibTeX record journals/mr/KawaharaWKK18
@article{DBLP:journals/mr/KawaharaWKK18, author = {C. Kawahara and Y. Wada and S. Kinouchi and H. Kobayashi}, title = {Non-destructive estimation method on cosmic ray ruggedness of power semiconductors using repetitive monitoring technique}, journal = {Microelectron. Reliab.}, volume = {88-90}, pages = {957--960}, year = {2018}, url = {https://doi.org/10.1016/j.microrel.2018.07.147}, doi = {10.1016/J.MICROREL.2018.07.147}, timestamp = {Sat, 22 Feb 2020 19:27:36 +0100}, biburl = {https://dblp.org/rec/journals/mr/KawaharaWKK18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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