KasprowiczP03'

BibTeX

@article{DBLP:journals/mr/KasprowiczP03,
  author    = {Dominik Kasprowicz and
               Witold A. Pleskacz},
  title     = {Improvement of integrated circuit testing reliability by
               using the defect based approach},
  journal   = {Microelectronics Reliability},
  volume    = {43},
  number    = {6},
  year      = {2003},
  pages     = {945-953},
  ee        = {http://dx.doi.org/10.1016/S0026-2714(03)00092-1},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}