BibTeX record journals/mr/JohALXZ11

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@article{DBLP:journals/mr/JohALXZ11,
  author       = {Jungwoo Joh and
                  Jes{\'{u}}s A. del Alamo and
                  Kurt Langworthy and
                  Sujing Xie and
                  Tsvetanka Zheleva},
  title        = {Role of stress voltage on structural degradation of GaN high-electron-mobility
                  transistors},
  journal      = {Microelectron. Reliab.},
  volume       = {51},
  number       = {2},
  pages        = {201--206},
  year         = {2011},
  url          = {https://doi.org/10.1016/j.microrel.2010.08.021},
  doi          = {10.1016/J.MICROREL.2010.08.021},
  timestamp    = {Sat, 22 Feb 2020 19:27:24 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/JohALXZ11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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