JangPILMS08'

@article{DBLP:journals/mr/JangPILMS08,
  author    = {Changsoo Jang and
               Seungbae Park and
               Bill Infantolino and
               Lawrence Lehman and
               Ryan Morgan and
               Dipak Sengupta},
  title     = {Failure analysis of contact probe pins for SnPb and Sn applications},
  journal   = {Microelectronics Reliability},
  volume    = {48},
  number    = {6},
  year      = {2008},
  pages     = {942-947},
  ee        = {http://dx.doi.org/10.1016/j.microrel.2008.03.015},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}