BibTeX record journals/mr/JacquetSCRAZdM15

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@article{DBLP:journals/mr/JacquetSCRAZdM15,
  author       = {Thomas Jacquet and
                  Grazia Sasso and
                  Anjan Chakravorty and
                  Niccol{\`{o}} Rinaldi and
                  Klaus Aufinger and
                  Thomas Zimmer and
                  Vincenzo d'Alessandro and
                  Cristell Maneux},
  title        = {Reliability of high-speed SiGe: {C} {HBT} under electrical stress
                  close to the {SOA} limit},
  journal      = {Microelectron. Reliab.},
  volume       = {55},
  number       = {9-10},
  pages        = {1433--1437},
  year         = {2015},
  url          = {https://doi.org/10.1016/j.microrel.2015.06.092},
  doi          = {10.1016/J.MICROREL.2015.06.092},
  timestamp    = {Sat, 22 Feb 2020 19:28:13 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/JacquetSCRAZdM15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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