BibTeX record journals/mr/JacobR08

download as .bib file

@article{DBLP:journals/mr/JacobR08,
  author       = {Peter Jacob and
                  Werner Rothkirch},
  title        = {Unusual defects, generated by wafer sawing: Diagnosis, mechanisms
                  and how to distinguish from related failures},
  journal      = {Microelectron. Reliab.},
  volume       = {48},
  number       = {8-9},
  pages        = {1253--1257},
  year         = {2008},
  url          = {https://doi.org/10.1016/j.microrel.2008.06.040},
  doi          = {10.1016/J.MICROREL.2008.06.040},
  timestamp    = {Sat, 22 Feb 2020 19:28:45 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/JacobR08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.