@article{DBLP:journals/mr/ItoNHAKISSH02,
author = {Shinya Ito and
Hiroaki Namba and
Tsuyoshi Hirata and
Koichi Ando and
Shin Koyama and
Nobuyuki Ikezawa and
Tatsuya Suzuki and
Takehiro Saitoh and
Tadahiko Horiuchi},
title = {Effect of mechanical stress induced by etch-stop nitride:
impact on deep-submicron transistor performance},
journal = {Microelectronics Reliability},
volume = {42},
number = {2},
year = {2002},
pages = {201-209},
ee = {http://dx.doi.org/10.1016/S0026-2714(01)00238-4},
bibsource = {DBLP, http://dblp.uni-trier.de}
}