DBLP BibTeX Record 'journals/mr/Iannuzzo05'

@article{DBLP:journals/mr/Iannuzzo05,
  author    = {Francesco Iannuzzo},
  title     = {Non-destructive Testing Technique for MOSFET's Characterisation
               during Soft-Switching ZVS Operations},
  journal   = {Microelectronics Reliability},
  volume    = {45},
  number    = {9-11},
  year      = {2005},
  pages     = {1738-1741},
  ee        = {http://dx.doi.org/10.1016/j.microrel.2005.07.100},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}