BibTeX record journals/mr/HurleyCMHG07

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@article{DBLP:journals/mr/HurleyCMHG07,
  author       = {Paul K. Hurley and
                  Karim Cherkaoui and
                  S. McDonnell and
                  G. Hughes and
                  A. W. Groenland},
  title        = {Characterisation and passivation of interface defects in {(1} 0 0)-Si/SiO\({}_{\mbox{2}}\)/HfO\({}_{\mbox{2}}\)/TiN
                  gate stacks},
  journal      = {Microelectron. Reliab.},
  volume       = {47},
  number       = {8},
  pages        = {1195--1201},
  year         = {2007},
  url          = {https://doi.org/10.1016/j.microrel.2006.09.030},
  doi          = {10.1016/J.MICROREL.2006.09.030},
  timestamp    = {Fri, 13 Nov 2020 09:24:39 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/HurleyCMHG07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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