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BibTeX record journals/mr/HungKCY10
@article{DBLP:journals/mr/HungKCY10, author = {H. J. Hung and James B. Kuo and D. Chen and Chih{-}Sheng Yeh}, title = {Gate tunneling leakage current behavior of 40 nm {PD} {SOI} {NMOS} device considering the floating body effect}, journal = {Microelectron. Reliab.}, volume = {50}, number = {5}, pages = {607--609}, year = {2010}, url = {https://doi.org/10.1016/j.microrel.2010.01.015}, doi = {10.1016/J.MICROREL.2010.01.015}, timestamp = {Thu, 09 Jun 2022 16:39:39 +0200}, biburl = {https://dblp.org/rec/journals/mr/HungKCY10.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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