BibTeX record journals/mr/HungKCY10

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@article{DBLP:journals/mr/HungKCY10,
  author       = {H. J. Hung and
                  James B. Kuo and
                  D. Chen and
                  Chih{-}Sheng Yeh},
  title        = {Gate tunneling leakage current behavior of 40 nm {PD} {SOI} {NMOS}
                  device considering the floating body effect},
  journal      = {Microelectron. Reliab.},
  volume       = {50},
  number       = {5},
  pages        = {607--609},
  year         = {2010},
  url          = {https://doi.org/10.1016/j.microrel.2010.01.015},
  doi          = {10.1016/J.MICROREL.2010.01.015},
  timestamp    = {Thu, 09 Jun 2022 16:39:39 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/HungKCY10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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