BibTeX record journals/mr/HuangWLZZTZLW11

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@article{DBLP:journals/mr/HuangWLZZTZLW11,
  author       = {Ru Huang and
                  Runsheng Wang and
                  Changze Liu and
                  Liangliang Zhang and
                  Jing Zhuge and
                  Yu Tao and
                  Jinbin Zou and
                  Yuchao Liu and
                  Yangyuan Wang},
  title        = {{HCI} and {NBTI} induced degradation in gate-all-around silicon nanowire
                  transistors},
  journal      = {Microelectron. Reliab.},
  volume       = {51},
  number       = {9-11},
  pages        = {1515--1520},
  year         = {2011},
  url          = {https://doi.org/10.1016/j.microrel.2011.07.080},
  doi          = {10.1016/J.MICROREL.2011.07.080},
  timestamp    = {Sat, 22 Feb 2020 19:26:52 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/HuangWLZZTZLW11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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