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BibTeX record journals/mr/HuangWHYZW03
@article{DBLP:journals/mr/HuangWHYZW03, author = {Ru Huang and Jinyan Wang and Jin He and Min Yu and Xing Zhang and Yangyuan Wang}, title = {Hot carrier degradation behavior in {SOI} dynamic-threshold-voltage nMOSFET's (n-DTMOSFET) measured by gated-diode configuration}, journal = {Microelectron. Reliab.}, volume = {43}, number = {5}, pages = {707--711}, year = {2003}, url = {https://doi.org/10.1016/S0026-2714(03)00038-6}, doi = {10.1016/S0026-2714(03)00038-6}, timestamp = {Tue, 04 Jun 2024 17:15:07 +0200}, biburl = {https://dblp.org/rec/journals/mr/HuangWHYZW03.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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