BibTeX record journals/mr/HuangSLL14

download as .bib file

@article{DBLP:journals/mr/HuangSLL14,
  author       = {X. D. Huang and
                  R. P. Shi and
                  C. H. Leung and
                  Pui{-}To Lai},
  title        = {Charge-trapping characteristics of BaTiO\({}_{\mbox{3}}\) with and
                  without nitridation for nonvolatile memory applications},
  journal      = {Microelectron. Reliab.},
  volume       = {54},
  number       = {11},
  pages        = {2388--2391},
  year         = {2014},
  url          = {https://doi.org/10.1016/j.microrel.2014.05.002},
  doi          = {10.1016/J.MICROREL.2014.05.002},
  timestamp    = {Mon, 02 Oct 2023 20:48:15 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/HuangSLL14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.